{"Content":"\r\n\t\t\t\t
<\/p>\r\n\t\t\t\t\t\t\t
| Item<\/th> | Type\/Dopant<\/th> | Orientation<\/th> | More Specs<\/th> | Surface\r\n<\/th>\r\n\t\t\t\t\t\t\t\t<\/tr>\r\n\t\t\t\t\t\t\t\t<\/thead>\r\n\t\t\t\t\t\t\t\t | |||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| InP wafer<\/b><\/td> | P-type\/Zn<\/span><\/td> | <100> \/-0.5degree<\/span><\/td> | Growth\u00a0Method:LEC Size:\u00a0dia50.8\u00a0x\u00a00.5\u00a0mm Carrier\u00a0concentration:(1-4)\u00a0x\u00a01018\u00a0cm-3 Mobility:\u00a0>50-60\u00a0cm2\/V.s EPD:<=\u00a010000\u00a0cm-2 Major\u00a0flat\u00a0orientation:<110>\/<1-10> <\/td> | SSP\/DSP<\/span><\/td><\/tr>| InP wafer<\/b><\/td> | N-type\/S<\/span><\/td> | <100> \/-0.5degree<\/span><\/td> | Growth\u00a0Method:LEC | Size:\u00a0dia50.8\u00a0x\u00a00.5\u00a0mm Carrier\u00a0concentration:(1-4)\u00a0x\u00a01018\u00a0cm-3 Mobility:\u00a0>50-60\u00a0cm2\/V.s EPD:<=\u00a010000\u00a0cm-2 Major\u00a0flat\u00a0orientation:<110>\/<1-10> <\/td> SSP\/DSP<\/span><\/td><\/tr> | InP wafer<\/b><\/td> | N-type\/Fe<\/span><\/td> | <100> \/-0.5degree<\/span><\/td> | Growth\u00a0Method:LEC | Size:\u00a0dia50.8\u00a0x\u00a00.5\u00a0mm Carrier\u00a0concentration:(1-4)\u00a0x\u00a01018\u00a0cm-3 Mobility:\u00a0>50-60\u00a0cm2\/V.s EPD:<=\u00a010000\u00a0cm-2 Major\u00a0flat\u00a0orientation:<110>\/<1-10> <\/td> SSP\/DSP<\/span><\/td><\/tr> | InP wafer<\/b><\/td> | SEMI-insulating<\/span><\/td> | <100> \/-0.5degree<\/span><\/td> | Growth\u00a0Method:LEC | Size:\u00a0dia50.8\u00a0x\u00a00.5\u00a0mm Carrier\u00a0concentration:(1-4)\u00a0x\u00a01018\u00a0cm-3 Mobility:\u00a0>50-60\u00a0cm2\/V.s EPD:<=\u00a010000\u00a0cm-2 Major\u00a0flat\u00a0orientation:<110>\/<1-10> <\/td> SSP\/DSP<\/span><\/td><\/tr>\r\n\t\t\t\t\t\t\t\t<\/tbody>\r\n\t\t\t\t\t\t\t<\/table>\r\n\t\t\t\t\t\t\r\n\t\t\t\t\t | \r\n\t\t\t\t\t\t |